References on High-speed AFM 

 

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2014

1

Ahmad Ahmad, Andreas Schuh, and Ivo W. Rangelow

Adaptive AFM scan speed control for high aspect ratio fast structure tracking

Rev. Sci. Instrum.  85, 103706 (2014). (PDF File)

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2012

1

Mohamed Husain, Thomas Boudier, Perrine Paul-Gilloteaux, Ignacio Casuso and Simon Scheuring

Software for drift compensation, particle tracking and particle analysis of high-speed atomic force microscopy image series

J. Mol. Recognit. 25: 292-298 (2012) (PDF File)

2

Blake W. Erickson, Severine Coquoz, Jonathan D. Adams, Daniel J. Burns and Georg E. Fantner

Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing

Beilstein J. Nanotechnol. 3, 747?758 (2012) (PDF file)

2011

1

Quanfeng Li and Qingyou Lu

Atomic resolution ultrafast scanning tunneling microscope with scan rate breaking the resonant frequency of a quartz tuning fork resonator

Rev. Sci. Instrum. 82, 053705 (2011) (PDF File)

2

H. Torun, D. Torello, and F. L. Degertekin

Note: Seesaw actuation of atomic force microscope probes for improved imaging bandwidth and displacement range

Rev. Sci. Instrum. 82, 086104 (2011). (PDF File)

3

A Phase Compensating Inverse Dynamics Method for High Speed AFM Imaging

I. M. Malovichko, A. Yu. Ostashenko, and S. I. Leesment

Bulletin of the Russian Academy of Sciences: Physics, 75(1): 9–11 (2011). (PDF File)

4

High efficiency laser photothermal excitation of microcantilever vibrations in air and liquids

Daniel Kiracofe, Kei Kobayashi, Aleksander Labuda, Arvind Raman, and Hirofumi Yamada

Rev. Sci. Instrum. 82, 013702 (2011). (PDF File)

5

Design of mechanical components for vibration reduction in an atomic force microscope

Chulsoo Kim, Jongkyu Jung, Woosub Youm, and Kyihwan Park

Rev. Sci. Instrum. 82, 035102 (2011). (PDF File)

 

2010

1

MEMS-based fast scanning probe microscopes

F.C. Tabak, E.C.M.Disseldorp, G.H.Wortel, A.J.Katan, M.B.S.Hesselberth, T.H. Oosterkamp, J.W.M. Frenken, W.M.vanSpengen

Ultramicroscopy 110: 599-604 (2010) (PDF File)

2

High-speed cycloid-scan atomic force microscopy

YK Yong1, S O R Moheimani1 and I R Petersen2

Nanotechnology 21: 365503 (4pp) (2010). (PDF File)

3

A.J. Fleming, B.J. Kenton, K.K. Leang

Bridging the gap between conventional and video-speed scanning probe microscopes

Ultramicroscopy 110: 1205-214 (2010) (PDF File)

4

Cantilevered bimorph-based scanner for high speed atomic force microscopy with large scanning range

Yusheng Zhou, Guangyi Shang, Wei Cai, and Jun-en Yao

Rev. Sci. Instrum. 81: 053708 (2010) (PDF File)

5

Active damping of a piezoelectric tube scanner using self-sensing piezo actuation

S. Kuiper, G. Schitter

Mechatronics 20: 656-665 (2010) (PDF File)

6

High-speed atomic force microscopy for large scan sizes using small cantilevers

Christoph Braunsmann and Tilman E Sch¨affer

Nanotechnology 21: 225705 (7pp) (2010). (PDF File)

7

Ultra-Fast Dual-Stage Vertical Positioning for High Performance SPMs

Andrew J. Fleming, Brian J. Kenton and Kam K. Leang

IEEE Transactions on Control Systems Technology 19 (1), art. no. 5411958, pp. 156-165 (2010) (PDF File)

8

Molecular dynamics of DNA and nucleosomes in solution studiedby fast-scanning atomic force microscopy

Yuki Suzuki, YujiHiguchi, Kohji Hizume, Masatoshi Yokokawa, Shige H.Yoshimura,
Kenichi Yoshikawa, KunioTakeyasu

Ultramicroscopy 110: 682–688 (2010) (PDF File)

9

Dynamics of leading lamellae of living fibroblasts visualized by high-speed scanning probe microscopy

Kazushi Tamura, Takeomi Mizutani, Hisashi Haga, Kazushige Kawabata

Histochem Cell Biol 133:59–67 (2010). (PDF File)

 

 

2009

1

Theoretical basis of parametric-resonance-based atomic force microscopy

G. Prakash, S. Hu, A. Raman, R. Reifenberger

Phys. Rev. B 79, 094304 (2009) (PDF File)

2

Large scan area high-speed atomic force microscopy using a resonant scanner

B. Zhao, J. P. Howard-Knight, A. D. L. Humphris, L. Kailas, E. C. Ratcliffe, S. J. Foster, and J. K. Hobbs

Rev. Sci. Instrum. 80, 093707 (2009) (PDF File)

3

Wideband digital frequency detector with subtraction-based phase comparator for frequency modulation atomic force microscopy

Yuji Mitani, Mamoru Kubo, Ken-ichiro Muramoto, and Takeshi Fukuma

Rev. Sci. Instrum. 80, 083705 (2009) (PDF File)

4

Photothermal cantilever actuation for fast single-molecule force spectroscopy

Stefan W. Stahl, Elias M. Puchner, and Hermann E. Gaub

Rev. Sci. Instrum. 80, 073702 (2009) (PDF File)

5

Making a commercial atomic force microscope more accurate and faster using positive position feedback control

I. A. Mahmood and S. O. Reza Moheimani

Rev. Sci. Instrum. 80, 063705 (2009) (PDF File)

6

Signal transformation approach to fast nanopositioning

Abu Sebastian and S. O. Reza Moheimani

Rev. Sci. Instrum. 80: 076101 (2009) (PDF File)

 

2008

1

Scanning probe microscopy at video-rate

Georg Schitter, and Marcel J. Rost

MaterialsToday microscopy special issue:40-48 (2008). (PDF File)

2

Fast image scanning method in liquid-AFM without image distortion

Inhee Choi, Younghun Kim, JongHo Kim, Young In Yang, Jeongjin Lee, Suseung Lee, Surin Hong and Jongheop Yi

Nanotechnol. 19: 445701 (8 pp) (2008) (PDF File)

3

Inhee Choi, Younghun Kim, JongHo Kim, Young In Yang, Jeongjin Lee, Suseung Lee, Surin Hong and Jongheop Yi

Fast image scanning method in liquid-AFM without image distortion

Nanotechnology 19 (2008) 445701 (8pp) (PDF File)

2007

1

Breaking the speed limit with atomic force microscopy

L.M. Picco, L. Bozec, A. Ulcinas, D.J. Engledew, M. Antognozzi, M.A. Horton, and M.J. Miles

Nanotechnology 18:044030 (4pp) (2007). (PDF File)

2

Fast-scan atomic force microscopy reveals that the type III restriction enzyme EcoP151 is capable of DNA translocation and loping.

Neal Crampton, Masatoshi Yokokawa, David T.F. Dryden, J. Michael Edwardson, Desirazu N. Rao, Kunio Takeyasu, Shige H. Yshimura, and Robert M. Henderson

Proc. natl. Acad. Sci. USA 104:12755-12760 (2007). (PDF File)

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2006

0

Parametric resonance based scanning probe microscopy

M. Moreno-Moreno, A. Raman, J. Gomez-Herrero, R. Reifenberger

Appl. Phys. Lett. 88, 193108 (2006) (PDF File)

1

Novel amplitude and frequency demodulation algorithm for a virtual dynamic atomic force microscope

J. Kokavecz, Z.Toth, Z.L. Horvath, P. Heszler and A. Mechler

Nanotechnology 17: S173–S177 (2006). (PDF File)

2

VideoAFM—a new tool for high speed surface analysis

Jamie K. Hobbs, Cvetelin Vasilev and Andrew D. L. Humphris

Analyst 131: 251-256 (2006). (PDF File)

3

Components for high speed atomic force microscopy

G.E. Fantner, G. Schitter, J.H. Kindt, T. Ivanov, K. Ivanova, R. Patel, N. Holten-Andersen, J. Adams, P.J. Thurner, I.W. Rangelow, and P. Hansma

Untramicroscopy 106:881-887 (2006) (PDF file)

4

Direct tip-position control using magnetic actuation for achieving fast scanning in tapping mode atomic force microscopy

G.R. Jayanth, Y. Jeong, and Chi-Hsiang Menq

Rev. Sci. Instrum. 77:053704 (2006)  (PDF file)

5

Direct tip-sample interaction force control for the dynamic mode atomic force microscopy

Y. Jeong, G.R. Jayanth, S.M. Jhiang, and Chi-Hsiang Menq

Appl. Phys. Lett. 88:204102 (2006)  (PDF file)

 

6

Direct tip-position control using magnetic actuation for achieving fast scanning in tapping mode atomic force microscopy

G.R. Jayanth, Y. Jeong, and Chi-Hsiang Menq

Rev. Sci. Instrum. 77:053704 (2006)  (PDF file)

 

 

7

A new atomic force microscope probe with force sensing integrated readout and active tip

A.G. Onaran, M. Balantekin, W. Lee, W.L. Hughes and B.A. Buchine, R.O. Guldiken, Z. Parlak, C.F. Quate, and F.L. Degertekin

Rev. Sci. Instrum. 77:023501 (2006) (PDF file)

8

Paul K. Hansma, Geog Schitter, George E. Fantner, and Craig Prater

High-speed Atomic Force Microscopy

Science 314:601-602 (2006). (PDF file)

9

Fast-scanning atomic force microscopy reveals the ATP/ADP-dependent conformational chnages of GroEL

Masatoshi Yokokawa, Chieko Wada, Toshio Ando, Nobuaki Sakai, Akira Yagi, Shige H. Yoshimura, and Kunio Takeyasu

Embo J. 25:4567-4576 (2006). (PDF File)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

2005

1

Sensor for direct measurement of interaction force in probe microscopy

F.L. Degertekin, A.G. Onaran, M. Balantekin, W. Lee, N.A. Hall, and C.F. Quate

Appl. Phys. Lett. 87:213109 (2005)  (PDF file)