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Patents
Issued US Patents 1. No. US 6617761B2 (Sep. 9, 2003) T. Ando and A. Toda, "Scanning unit and scanning microscope having the same. 2. No. US 6118121 (Sep. 12, 2000) T. Ando and Y. Hayashi, "Probe scanning mechanism for a scanning probe microscope" 3. No. US 5912461 (June 15, 1999) T. Ando and Y. Hayashi, "Probe scanning mechanism for a scanning probe microscope" 4. No. US 7556968 (July 2, 2009) T. Ando and Y. Hayashi, "Scanning probe microscope and molecular structure change observation method" 5. No. US 7975315 B2 (July 5, 2011) T. Ando, T. Uchihashi, N. Kodera, N. Takahashi, "Atomic Force Microscope" (Fast detection of resonant frequency shift of a cantilever) 6. No. US 7975314 B2 (July 5, 2011) T. Ando, "Scanning Probe Microscope and Active Damping Drive Control Device" (Nested loop method for active damping of z-scanner) 7. No. US 7958565 B2 (June 7, 2011) T. Ando, T. Uchihashi, N. Kodera, H. Yamashita, "Scan type Probe Microscope and Cantilever Drive Device" (Laser driving of a cantilever and compensation method) 8. No. US 7954165 B2 (May 31, 2011) T. Ando, M. Sakashita, T. Uchihashi, "Scanning Probe Microscope" (Drift compensation method) 9. No. US 8217367 B2 (July 10, 2012) T. Fukuma, T. Ando, and Y. Okazaki, "Scanning device for scanning probe microscope" (New counterbalance method for z-scanner)
Issued European Patents 1. No. EP 1898204 (Sep. 12, 2018) T. Ando, T. Uchihashi, N. Kodera, N. Takahashi," Atomic force microscope" 2. No. EP 2063250 (Sep. 5, 2018) T. Ando, T. Uchihashi, N. Kodera, H. Yamashita,"Scan type probe microscope and cantilever drive device" 3. No. EP 1972920B1 (Sep. 26, 2018) T. Uchihashi, T. Ando, H. Yamashita, "Scanning probe microscope" (for fast phase detection) 4. No. EP-2060901B1 (Dec. 18, 2019) T. Ando, "Scan type probe microscope and active damping drive control device" 5.
No. 112009001338.4 (Aug. 5, 2021, Germany)
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