References on High-speed AFM
To open the PDF files you need
2014
| 1 |
Ahmad Ahmad, Andreas Schuh, and Ivo W. Rangelow Adaptive AFM scan speed control for high aspect ratio fast structure tracking Rev. Sci. Instrum. 85, 103706 (2014). (PDF File) |
| 2 |
2012
| 1 |
Mohamed Husain, Thomas Boudier, Perrine Paul-Gilloteaux, Ignacio Casuso and Simon ScheuringSoftware for drift compensation, particle tracking and particle analysis of high-speed atomic force microscopy image series J. Mol. Recognit. 25: 292-298 (2012) (PDF File) |
| 2 |
Blake W. Erickson, Severine Coquoz, Jonathan D. Adams, Daniel J. Burns and Georg E. Fantner Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing Beilstein J. Nanotechnol. 3, 747?758 (2012) (PDF file) |
2011
| 1 |
Quanfeng Li and Qingyou Lu Atomic resolution ultrafast scanning tunneling microscope with scan rate breaking the resonant frequency of a quartz tuning fork resonator Rev. Sci. Instrum. 82, 053705 (2011) (PDF File) |
| 2 |
H. Torun, D. Torello, and F. L. Degertekin Note: Seesaw actuation of atomic force microscope probes for improved imaging bandwidth and displacement range Rev. Sci. Instrum. 82, 086104 (2011). (PDF File) |
| 3 |
A Phase Compensating Inverse Dynamics Method for High Speed AFM Imaging I. M. Malovichko, A. Yu. Ostashenko, and S. I. Leesment Bulletin of the Russian Academy of Sciences: Physics, 75(1): 9–11 (2011). (PDF File) |
| 4 |
High efficiency laser photothermal excitation of microcantilever vibrations in air and liquids Daniel Kiracofe, Kei Kobayashi, Aleksander Labuda, Arvind Raman, and Hirofumi Yamada Rev. Sci. Instrum. 82, 013702 (2011). (PDF File) |
| 5 |
Design of mechanical components for vibration reduction in an atomic force microscope Chulsoo Kim, Jongkyu Jung, Woosub Youm, and Kyihwan Park Rev. Sci. Instrum. 82, 035102 (2011). (PDF File) |
2010
| 1 |
MEMS-based fast scanning probe microscopes F.C. Tabak, E.C.M.Disseldorp, G.H.Wortel, A.J.Katan, M.B.S.Hesselberth, T.H. Oosterkamp, J.W.M. Frenken, W.M.vanSpengen Ultramicroscopy 110: 599-604 (2010) (PDF File) |
| 2 |
High-speed cycloid-scan atomic force microscopy YK Yong1, S O R Moheimani1 and I R Petersen2 Nanotechnology 21: 365503 (4pp) (2010). (PDF File) |
| 3 |
A.J. Fleming, B.J. Kenton, K.K. Leang Bridging the gap between conventional and video-speed scanning probe microscopes Ultramicroscopy 110: 1205-214 (2010) (PDF File) |
| 4 |
Cantilevered bimorph-based scanner for high speed atomic force microscopy with large scanning range Yusheng Zhou, Guangyi Shang, Wei Cai, and Jun-en Yao Rev. Sci. Instrum. 81: 053708 (2010) (PDF File) |
| 5 |
Active damping of a piezoelectric tube scanner using self-sensing piezo actuation S. Kuiper, G. Schitter Mechatronics 20: 656-665 (2010) (PDF File) |
| 6 |
High-speed atomic force microscopy for large scan sizes using small cantilevers Christoph Braunsmann and Tilman E Sch¨affer Nanotechnology 21: 225705 (7pp) (2010). (PDF File) |
| 7 |
Ultra-Fast Dual-Stage Vertical Positioning for High Performance SPMs Andrew J. Fleming, Brian J. Kenton and Kam K. Leang IEEE Transactions on Control Systems Technology 19 (1), art. no. 5411958, pp. 156-165 (2010) (PDF File) |
| 8 |
Molecular dynamics of DNA and nucleosomes in solution studiedby fast-scanning atomic force microscopy
Yuki
Suzuki,
YujiHiguchi,
Kohji
Hizume,
Masatoshi
Yokokawa,
Shige
H.Yoshimura, Ultramicroscopy 110: 682–688 (2010) (PDF File) |
| 9 |
Dynamics of leading lamellae of living fibroblasts visualized by high-speed scanning probe microscopy Kazushi Tamura, Takeomi Mizutani, Hisashi Haga, Kazushige Kawabata Histochem Cell Biol 133:59–67 (2010). (PDF File) |
2009
| 1 |
Theoretical basis of parametric-resonance-based atomic force microscopy G. Prakash, S. Hu, A. Raman, R. Reifenberger Phys. Rev. B 79, 094304 (2009) (PDF File) |
| 2 |
Large scan area high-speed atomic force microscopy using a resonant scanner B. Zhao, J. P. Howard-Knight, A. D. L. Humphris, L. Kailas, E. C. Ratcliffe, S. J. Foster, and J. K. Hobbs Rev. Sci. Instrum. 80, 093707 (2009) (PDF File) |
| 3 |
Wideband digital frequency detector with subtraction-based phase comparator for frequency modulation atomic force microscopy Yuji Mitani, Mamoru Kubo, Ken-ichiro Muramoto, and Takeshi Fukuma Rev. Sci. Instrum. 80, 083705 (2009) (PDF File) |
| 4 |
Photothermal cantilever actuation for fast single-molecule force spectroscopy Stefan W. Stahl, Elias M. Puchner, and Hermann E. Gaub Rev. Sci. Instrum. 80, 073702 (2009) (PDF File) |
| 5 |
Making a commercial atomic force microscope more accurate and faster using positive position feedback control I. A. Mahmood and S. O. Reza Moheimani Rev. Sci. Instrum. 80, 063705 (2009) (PDF File) |
| 6 |
Signal transformation approach to fast nanopositioning Abu Sebastian and S. O. Reza Moheimani Rev. Sci. Instrum. 80: 076101 (2009) (PDF File) |
2008
| 1 |
Scanning probe microscopy at video-rate Georg Schitter, and Marcel J. Rost MaterialsToday microscopy special issue:40-48 (2008). (PDF File) |
| 2 |
Fast image scanning method in liquid-AFM without image distortion Inhee Choi, Younghun Kim, JongHo Kim, Young In Yang, Jeongjin Lee, Suseung Lee, Surin Hong and Jongheop Yi Nanotechnol. 19: 445701 (8 pp) (2008) (PDF File) |
| 3 |
Inhee Choi, Younghun Kim, JongHo Kim, Young In Yang, Jeongjin Lee, Suseung Lee, Surin Hong and Jongheop Yi Fast image scanning method in liquid-AFM without image distortion Nanotechnology 19 (2008) 445701 (8pp) (PDF File) |
2007
| 1 |
Breaking the speed limit with atomic force microscopy L.M. Picco, L. Bozec, A. Ulcinas, D.J. Engledew, M. Antognozzi, M.A. Horton, and M.J. Miles Nanotechnology 18:044030 (4pp) (2007). (PDF File) |
| 2 |
Fast-scan atomic force microscopy reveals that the type III restriction enzyme EcoP151 is capable of DNA translocation and loping. Neal Crampton, Masatoshi Yokokawa, David T.F. Dryden, J. Michael Edwardson, Desirazu N. Rao, Kunio Takeyasu, Shige H. Yshimura, and Robert M. Henderson Proc. natl. Acad. Sci. USA 104:12755-12760 (2007). (PDF File) |
| 3 | |
| 4 |
2006
| 0 |
Parametric resonance based scanning probe microscopy M. Moreno-Moreno, A. Raman, J. Gomez-Herrero, R. Reifenberger Appl. Phys. Lett. 88, 193108 (2006) (PDF File) |
| 1 |
Novel amplitude and frequency demodulation algorithm for a virtual dynamic atomic force microscope J. Kokavecz, Z.Toth, Z.L. Horvath, P. Heszler and A. Mechler Nanotechnology 17: S173–S177 (2006). (PDF File) |
| 2 |
VideoAFM—a new tool for high speed surface analysis Jamie K. Hobbs, Cvetelin Vasilev and Andrew D. L. Humphris Analyst 131: 251-256 (2006). (PDF File) |
| 3 |
Components for high speed atomic force microscopy G.E. Fantner, G. Schitter, J.H. Kindt, T. Ivanov, K. Ivanova, R. Patel, N. Holten-Andersen, J. Adams, P.J. Thurner, I.W. Rangelow, and P. Hansma Untramicroscopy 106:881-887 (2006) (PDF file) |
| 4 |
Direct tip-position control using magnetic actuation for achieving fast scanning in tapping mode atomic force microscopy G.R. Jayanth, Y. Jeong, and Chi-Hsiang Menq Rev. Sci. Instrum. 77:053704 (2006) (PDF file) |
|
5 |
Direct tip-sample interaction force control for the dynamic mode atomic force microscopy Y. Jeong, G.R. Jayanth, S.M. Jhiang, and Chi-Hsiang Menq Appl. Phys. Lett. 88:204102 (2006) (PDF file) |
|
6 |
Direct tip-position control using magnetic actuation for achieving fast scanning in tapping mode atomic force microscopy G.R. Jayanth, Y. Jeong, and Chi-Hsiang Menq Rev. Sci. Instrum. 77:053704 (2006) (PDF file) |
|
7 |
A new atomic force microscope probe with force sensing integrated readout and active tip A.G. Onaran, M. Balantekin, W. Lee, W.L. Hughes and B.A. Buchine, R.O. Guldiken, Z. Parlak, C.F. Quate, and F.L. Degertekin Rev. Sci. Instrum. 77:023501 (2006) (PDF file) |
|
8 |
Paul K. Hansma, Geog Schitter, George E. Fantner, and Craig Prater High-speed Atomic Force Microscopy Science 314:601-602 (2006). (PDF file) |
|
9 |
Fast-scanning atomic force microscopy reveals the ATP/ADP-dependent conformational chnages of GroEL Masatoshi Yokokawa, Chieko Wada, Toshio Ando, Nobuaki Sakai, Akira Yagi, Shige H. Yoshimura, and Kunio Takeyasu Embo J. 25:4567-4576 (2006). (PDF File) |
2005
| 1 |
Sensor for direct measurement of interaction force in probe microscopy F.L. Degertekin, A.G. Onaran, M. Balantekin, W. Lee, N.A. Hall, and C.F. Quate Appl. Phys. Lett. 87:213109 (2005) (PDF file) |